FTIR-Presentazione (1)

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    Fourier Transform Infrared(FT-IR) Spectroscopy

    Theory and Applications

    THE ELECTROMAGNETIC SPECTRUM

    INFRAREDGAMMA RAYS X RAYS UV VISIBLE

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    Introduction to FTInfrared

    Spectroscopy

    What is infrared spectroscopy?

    Theory of FT-IR

    FT-IR Advantages?

    New FT/IR4000-6000Series

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    What is Infrared? Infrared radiation lies between the visible and microwave portions

    of the electromagnetic spectrum.

    Infrared waves have wavelengths longer than visible and shorterthan microwaves, and have frequencies which are lower thanvisible and higher than microwaves.

    The Infrared region is divided into: near, mid and far-infrared.

    Near-infrared refers to the part of the infrared spectrum that isclosest to visible light and far-infrared refers to the part that iscloser to the microwave region.

    Mid-infrared is the region between these two.

    The primary source of infrared radiation is thermal radiation. (heat)

    It is the radiation produced by the motion of atoms and moleculesin an object. The higher the temperature, the more the atoms andmolecules move and the more infrared radiation they produce.

    Any object radiates in the infrared. Even an ice cube, emitsinfrared.

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    What is Infrared? (Cont.)

    Humans, at normal body temperature, radiatemost strongly in the infrared, at a

    wavelength of about 10 microns (A micronis the term commonly used in astronomy fora micrometer or one millionth of a meter). In

    the image to the left, the red areas are thewarmest, followed by yellow, green and

    blue (coolest).

    The image to the right shows a cat in theinfrared. The yellow-white areas are thewarmest and the purple areas are the coldest.

    This image gives us a different view of afamiliar animal as well as information that wecould not get from a visible light picture.Notice the cold nose and the heat from the cat'seyes, mouth and ears.

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    Infrared Spectroscopy

    The bonds between atoms in the molecule stretch and bend,

    absorbing infrared energy and creating the infrared

    spectrum.

    Symmetric Stretch Antisymmetric Stretch Bend

    A molecule such as H2O will absorb infrared light when the vibration

    (stretch or bend) results in a molecular dipole moment change

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    Energy levels in Infrared Absorption

    Infrared absorption occurs among the ground vibrational states, the

    energy differences, and corresponding spectrum, determined by the

    specific molecular vibration(s). The infrared absorption is a net

    energy gain for the molecule and recorded as an energy loss for the

    analysis beam.

    hExcited

    states

    Ground

    (vibrational)

    states

    h(1 -0 )h(1 - 0)

    h(2 - 1)(overtone)

    Infrared Absorption and

    Emission

    1

    2

    0

    3

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    Infrared Spectroscopy

    A molecule can be characterized (identified) by its molecularvibrations, based on the absorption and intensity of specific

    infrared wavelengths.

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    Infrared Spectroscopy

    For isopropyl alcohol, CH(CH3)2OH, the infrared absorptionbands identify the various functional groups of the molecule.

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    Capabilities of Infrared Analysis

    Identification and quantitation of organic solid,liquid or gas samples.

    Analysis of powders, solids, gels, emulsions,

    pastes, pure liquids and solutions, polymers, pure

    and mixed gases.

    Infrared used for research, methods development,

    quality control and quality assurance applications.

    Samples range in size from single fibers only 20

    microns in length to atmospheric pollution studies

    involving large areas.

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    Applications of Infrared Analysis

    Pharmaceutical research Forensic investigations

    Polymer analysis

    Lubricant formulation and fuel additives

    Foods research

    Quality assurance and control

    Environmental and water quality analysis

    methods

    Biochemical and biomedical research

    Coatings and surfactants

    Etc.

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    To separate IR light, a grating is used.

    Grating

    Light source

    Detector

    Sample

    Slit

    To select the specified IR light,

    A slit is used.

    Dispersion

    SpectrometerIn order to measure an IR spectrum,

    the dispersion Spectrometer takes

    several minutes.

    Also the detector receives only

    a few % of the energy of

    original light source.

    Fixed CCM

    B.S.

    Moving CCM

    IR Light source

    Sample

    Detector

    An interferogram is first made by

    the interferometer using IR light.

    The interferogram is calculated and transformed

    into a spectrum using a Fourier Transform (FT).

    FTIRIn order to measure an IR spectrum,

    FTIR takes only a few seconds.

    Moreover, the detector receives

    up to 50% of the energy of originallight source.

    (much larger than the dispersion

    spectrometer.)

    Comparison Beetween Dispersion Spectrometer and

    FTIR

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    Interferogram

    is made by an interferometer.

    Interferogram

    is transformed

    into a spectrum using a FT.

    BKG

    SB

    3000 2000 1000

    [cm-1]

    Sample

    SB

    Sample

    3000 2000 1000

    [cm-1]

    Sample/BKG

    IR spectrum

    %T

    3000 2000 1000 [cm-1]

    The Principles of FTIR Method

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    FTIR seminar

    Intensity Distribution and Temperature Dependency versus Wavelength of

    Black Body Radiation Energy

    2 5 2010

    105

    104

    103

    102

    10

    1

    10-1

    10-2

    10-3

    10-4

    0.1 0.2 0.5 1 50 100

    Wavelength / m

    6000K

    4000K

    2000K

    1000K

    500K

    300K

    200K

    Spe

    ctralirradianceW

    IR light source

    IR Light Source

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    FTIR seminar

    Interferometer

    He-Ne gas laser

    Fixed mirror

    Movable mirror

    Sample chamber

    Light

    source

    (ceramic)

    Detector

    (DLATGS)

    Beam splitter

    FT Optical System Diagram

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    Fixed mirror

    Movable mirror

    Fixed mirror

    Movable mirror

    Fixed mirror

    Movable mirror

    Same-phase interference

    wave shape

    Opposite-phase

    interference

    wave shape

    Same-phase interference

    wave shape0

    Movable mirror

    Interference pattern of lightmanifested by the optical-path

    difference

    Continuous phase shift

    Signalstrength

    (X)

    -2 - 0 2

    -2 - 0 2

    FTIR seminar

    Interference of two beams of light

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    Relationship between light source spectrum and the signal output from interferometer

    (a) Monochromatic

    light

    (b) Dichroic light

    (c) Continuous

    spectrum light

    All intensities are standardized.

    Light source spectrum Signal output from interference wave

    Time t

    Time t

    Time tI(t)

    I

    ( )

    Wavenumber

    Wavenumber

    Wavenumber

    IAz

    Az

    FTIR seminar

    Interference is a superpositioning of waves

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    FTIR seminar

    Interferometer interferogram

    Output of a Laser interferometer

    Primary interferometer interferogram

    that was sampled

    Optical path difference x

    Sampling of an actual interferogram

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    4000 400

    SBFourier transform

    Optical path difference[x]

    (Interferogram) (Single beam spectrum)

    Wavenumber[cm-1]

    Single

    st

    rength

    Time axis by FFT Wavenumber

    Fourier Transform

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    FTIR seminar

    TGS

    Operates at room temperature

    MCT

    Operates at the temperatur

    of liquid nitrogen

    D*(,

    f)(cmHz

    1/2W-1)

    1010

    109

    108

    Wavenumber[cm-1]4000 600

    Detector Properties

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    1.Better sensitivity and brightness

    - Allows simultaneous measurement over the entire wavenumber range- Requires no slit device, making good use of the available beam

    2.High wavenumber accuracy

    - Technique allows high speed sampling with the aid of laser light interference fringes

    - Requires no wavenumber correction

    - Provides wavenumber to an accuracy of 0.01 cm-1

    3. Resolution

    - Provides spectra of high resolution

    4. Stray light

    - Fourier Transform allows only interference signals to contribute to spectrum.

    Background light effects greatly lowers.

    - Allows selective handling of signals limiting intreference

    5. Wavenumber range flexibility

    - Simple to alter the instrument wavenumber range

    CO2 and H2O sensitive

    FT-IR Advantages and Disadvantages

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    FT-IR Advantages

    Fellgett's (multiplex) Advantage

    FT-IR collects all resolution elements with a completescan of the interferometer. Successive scans of the FT-IR instrument are coadded and averaged to enhance thesignal-to-noise of the spectrum.

    Theoretically, an infinitely long scan would average outall the noise in the baseline.

    The dispersive instrument collects data one wavelengthat a time and collects only a single spectrum. There isno good method for increasing the signal-to-noise of thedispersive spectrum.

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    FT-IR Advantages

    Connes Advantage

    an FT-IR uses a HeNe laser as an internal wavelength

    standard. The infrared wavelengths are calculated

    using the laser wavelength, itself a very precise and

    repeatable 'standard'.Wavelength assignment for the FT-IR spectrum is very

    repeatable and reproducible and data can be compared

    to digital libraries for identification purposes.

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    FT-IR Advantages

    Jacquinot Advantage

    FT-IR uses a combination of circular apertures andinterferometer travel to define resolution. To improvesignal-to-noise, one simply collects more scans.

    More energy is available for the normal infrared scanand various accessories can be used to solve varioussample handling problems.

    The dispersive instrument uses a rectangular slit tocontrol resolution and cannot increase the signal-to-noise for high resolution scans. Accessory use islimited for a dispersive instrument.

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    FT-IR Application Advantages

    Opaque or cloudy samples

    Energy limiting accessories such as diffuse reflectance or FT-

    IR microscopes

    High resolution experiments (as high as 0.001 cm-1 resolution)

    Trace analysis of raw materials or finished products

    Depth profiling and microscopic mapping of samples

    Kinetics reactions on the microsecond time-scale

    Analysis of chromatographic and thermogravimetric sample

    fractions

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    FT-IR Terms and Definitions

    Resolution (common definition) The separation of the variousspectral wavelengths, usually

    defined in wavenumbers (cm-1).

    A setting of 4 to 8 cm-1 is sufficient

    for most solid and liquid samples.Gas analysis experiments may need

    a resolution of 2 cm-1 or higher.

    Higher resolution experiments will

    have lower signal-to-noise.

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    FT-IR Terms and Definitions

    Resolution FT/IR Case

    A spectrum is said to be collected ata resolution of 1 cm-1 if 4 datapoints are collected within eachspectral interval of 1 cm-1 .

    In order to acquire a spectrum athigher, an increased number of data

    points is needed, requiring a longerstroke of the moving mirror.

    For higher resolution instrumentsan aperture is needed in order toimprove parallelism withininterferometer.

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    FT-IR Terms and Definitions

    Apodization - amathematical operation toreduce unwantedoscillation and noisecontributions from the

    interferogram and to avoidaberrations coming fromthe finite nature of real(non theoreticalinterferograms). Commonapodization functionsinclude Beer-Norton,Cosine and Happ-Genzel.

    Apodization

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    FT-IR Terms and Definitions

    Scan mode - Either single

    beam or ratio. Single

    beam can be a scan of the

    background (no sample)

    or the sample. Ratio

    mode always implies the

    sample spectrum divided

    by, or ratioed against, the

    single beam background.

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    FT-IR Terms and Definitions

    Scan(s) - a complete cycle of movement of the

    interferometer mirror. The number of scans collected

    affects the signal-to-noise ratio (SNR) of the final

    spectrum. The SNR doubles as the square of the

    number of scans collected; i.e. 1, 4, 16, 64, 256, .

    Scan speed or optical path velocity - the rate at which

    the interferometer mirror moves. For a DTGS detector,

    the SNR decreases as the scan speed increases.

    Scan range - spectral range selected for the analysis.

    The most useful spectral range for mid-infrared is 4000to 400 cm-1.

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    The highest S/N ratio in the world, 50,000:1 (FT/IR-6300) (Over sampling with 24-bit ADC)

    DSP-driven interferometer andnew ADC (18-bit to 24-bit)

    Digital control of the moving mirror drive using an advanced high speed digital signal processor (DSP) technologyThe outstanding performance of the ADC (Analog-to digital converter) and DSP (Digital signal processor) allows very rapid and accurate correction

    for the effects of velocity and position errors.

    Autoalignment for all models (The interferometer optics can always be aligned by the PC)

    In addition to proven technology for Rapid scanning and vacuum capabilities;

    a Step scan capability enables time-resolved studies similar to research models by Nicolet, Bruker and Bio-Rad.

    IR imaging with IMV-4000 multi-channel microscope for all models (Rapid scanning with a linear array MCT detector )

    PC communication and control using USB

    Aperture of7.1, 5.0, 3.5, 2.5, 1.8, 1.2, 0.9, 0.5 mm diameter for FT/IR-4100/4200

    Spectra Manager II (cross-platform software suite for JASCO spectroscopy systems) (Spectra Manager CFR: 21 CFR Part

    11 compliance)

    Research model capability (Upgradeable wavelength extension, high resolution, step scan)

    Improved Water Vapor and CO2 Compensation

    New Features of FTIR4000-6000Series

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    Polymer shell

    Improved instrument design

    Compact sizeSample compartment with

    same size as a higher class

    model

    FT/IR-400 Plus

    Aperture

    No additional optics for IR microscope interface

    Standard apertures for optimum S/N and resolution capability

    Easy replacement of light source and detector

    FT/IR-4100

    FT/IR-4200Microscope

    FTIR4000 Series

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    FT/IR-4000 Series purge design

    N2gas inlet

    Control valve

    Instrument purge is standard for all models of the FT/IR-4000 Series.

    FTIR4000 Series Purge System

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    Conventional method

    Find the zero crossings, then interpolate

    a matching set of IR data points.

    Over sampling method

    Reduction of high frequency noise by over sampling with a 16 times greater

    number of sampling points enables improvement of the S/N ratio.

    Pre-amp.

    Analog circuit

    Photo coupler

    Voice Coil

    HeNe laser

    Photo coupler

    Pre-amp.

    ADC

    DSPDAC

    Clock

    24-bit AD

    Voice Coil

    HeNe laser

    Accurate mirror drive

    And reduce flutter at

    low wavenumber range.

    FT/IR-4000 & 6000 series

    S/N ratio (Oversampling system)

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    FT/IR-6000 Series purge design

    N2gas inlet

    Purge control valve front side

    Instrument purge is standard for all models of the FT/IR-6000

    Series.

    FTIR6000 Series Purge/Vacuum System